各位研究生同学：

　　应大家学习需要，我所特邀请德国莱布尼兹.汉诺威大学Armin Feldhoff教授及我所苗澍研究员为研究生讲授“Applications of electron microscope for the characterization of catalytic materials”专业选修课程，1学分。

　　课程大纲：

　　On Wednesday 24 August 2016, instrument check for SEM and TEM will be made together with lab manager Prof. Miao Shu to be prepared for practical exercises SEM-1 to SEM-8 and TEM-1 to TEM-8.

　　24 to 26 August 2016

　　Lectures

　　Lecture 1-1, Basics of the scanning electron microscope I (SEM)

　　de-Broglie wave length, Lorentz force, electron sources, electron lenses (what does a lens do?),detectors, microscope column, beam-specimen interaction, excitation volume, stigmators, deflectors

　　Lectures 1-2 + 1-3, Basics of the scanning electron microscope II (SEM)

　　beam-specimen interaction, detectors, secondary electrons (SE), backscattered electrons (BSE), depth offocus, in-lens detection (high-resolution SEM), avoiding specimen charging, C s /C C -corrected SEM (ultra-high resolution)

　　Lecture 2-1, Basics of the transmission electron microscope I (TEM)

　　history, virology, fundamentals, lens in wave optics, the 3-stage TEM, optical path for imaging and diffraction, resolution limit, Fourier optics, diffraction absorption contrast

　　Lecture 2-2, Basics of the transmission electron microscope II (TEM)

　　phase contrast (high-resolution TEM), phase-amplitude diagrams,/4 phase plate, phase-contrast transfer function, point resolution, delocalisation, Cs-corrected microscope, contrast simulation (multisclice method), focal series reconstruction

　　Lecture 3-1, Diffraction and elemental analysis in the transmission electron microscope

　　analogies and differences between electron diffraction and x-ray diffraction, selected area electron diffraction (SAED),from parallel to convergent illumination, convergent beam electron diffraction (CBED),scanning transmission electron microscopy (STEM), analytical electron microscopy (AEM), x-ray spectroscopy (EDXS, WDXS, EMPA), electron energy-loss spectroscopy (EELS)

　　Lecture 3-2, Some practical advice (SEM + TEM)

　　sample preparation, media for image acquisition, avoiding beam damage

　　Practical Exercises

　　SEM (8 courses times 4 students = 32 students; courses SEM-1 to SEM-3 given by Prof. Feldhoff;courses SEM-4 to SEM-8 given by lab manager Prof. Miao Shu )

　　Demonstration of effect of working distance (objective lens focal length) on resolution and depth of focus; secondary electron imaging and energy-dispersive X-ray spectroscopy.

　　TEM (8 courses times 4 students = 32 students; all courses given by Prof. Feldhoff)

　　Demonstration of absorption contrast (bright-field, dark field) and selected area electron diffraction;how to avoid damage of beam-sensitive materials during observation.

　　上课时间：8月24日至26日

　　上课地点：能源基础楼一楼会议室

　　请相关专业的学生踊跃报名参加课程学习，并将报名表于8月15日之前发送至jiaoxue@dicp.ac.cn。

　　联系人：于晓

　　电话：84379558